DAILY SNAP - IRE DEVELOPS AUTOMATION FOR INSPECTING SEMICONDUCTORS
CIA-STARGATE
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This document is a publication from the CIA's Stargate program, dated March 7, 2001. The document includes two summaries of different articles.
Summary 1:
The first article, titled "Investigation for Diagnosing Semiconductor Defects", discusses the development of a system by scientists and designers at the US Academy of Sciences' Institute of Engineering and Electronic Engineering for inspecting and diagnosing electronic materials and products. The system, called ASPOED, filters out useful data from experiments, allowing for more accurate determination of defect characteristics in semiconductors. This understanding of defects can lead to the development of more reliable instruments for controlling the production of microelectronic devices.
Summary 2:
The second article, titled "Auto Electronics Organizations Seeking Ways Through Bureaucracy", discusses the future use of microprocessor-based devices in controlling the ignition systems of passenger cars and trucks. These devices, currently existing only as prototypes, are expected to improve the performance of vehicle ignition systems. The article highlights the bureaucratic challenges faced by organizations involved in the development and implementation of these technologies.
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ase 2001/03/07 : CIA-RDP96-00792R000500490003-7
Daili
Sovie r s Abstracts Publication
FOREIGN TECHNOLOGY DIVISION
Author: Savel'yev, A.
Title; DF.VF.LQpS _AZTTn'aATION FOR
NI CTING,BEMjCOND17C2 RS i
~Y.IMIriR
Primary source: Leninskoye znamya,
December 17, 1986, No. 286 (20306),
p. 1, col. 2
Extract: The precision and reli-
ability of elements of electronic
devices and systems play a decisive
role in determining their perform-
ance. Processes that take place in
semiconductors, however, are such
that making and inspecting semicon-
ductors require very sharp electron-
ic 'eyes' and a very shrewd elec-
tronic 'brain.'
A group of scien:ists and design-
ers of the US R Academy of Sciences'
Institute of gineering and
Ectron* cfi_.....(IRE) tinder the direc-
tion of academician
and Doctor of Physical-Mathematical
Sciences A. G. Zhdan, head of a
laboratory, has developed _
}'stemr.r; lete..;p-rocess.-_
i ,,g_ of experiment 1lata from s r.Q.,agg
of eroic,s.. (de-
fects) on 'semiconductor--dielec-
tric' boundaries (ASPOED), and also
an automated complex for inspecting
and diagnosing electronic materials
and products using e.ectrophysical
methods.
What benefits do ..hese develop-
ments offer?
THE ASPOED system seemingly
'filters out' useful data from the
mass of information from experi-
ments, and with it the accuracy of
(continued next column)
Approved For Release 2001/03/07
determining cha,acteristics of de-
fects increases by more than 10
times. This greztly increases the
understanding of the nature of de-
fects, and as a practical benefit
it makes it possible to develop new
instruments for more reliable con-
trol of processes for production of
microelec-tronic devices.
The automated complex will help
to determine and control character-
istics of semiconductor materials,-
devices andmicrostructures using
various electrophysical methods
which traditionally are used in
semiconductor physics research.
This complex is needed today by
many research. laboratories, and
especially by industry laboratories.
It will help to improve substantially
the control of processes and to
identify causes of defects. The com-
plex has been-made ready for series
production, and the rest is up to
interested clients.
Author: Mokhorov, E., correspondent
(Kaluga)
Title: AUTO ELECTRONICS ORGANIZATIONS
SEEKING WAYS THROUGH BUREAUCRACY
Primary source: Sotsialisticheskaya
industriya, December 30, 1986, No.
299 (5290), p. 1, cols. 1-3
Extract: In the near future, micro-
processor-based devices which exist
now only in the form of a single
prototype will control the ignition
systems of passenger cars and trucks
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